Foundations of Measurement, Vol. 2: Geometrical, Threshold...

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Foundations of Measurement, Vol. 2: Geometrical, Threshold and Probabilistic Representations

Name: Foundations of Measurement, Vol. 2: Geometrical, Threshold and Probabilistic Representations
ISBN: 9780124254022

Patrick Suppes, David H. Krantz, R. Duncan Luce, Amos Tversky

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Foundations of Measurement offers the most coherently organized treatment of the topics and issues central to measurement. Much of the research involved has been scattered over several decades and a multitude of journals--available in many instances only to specialties. With the publication of Volumes two and three of this important work, Foundations of Measurement is the most comprehensive presentation in the area of measurement.

种类:

Business & Economics

卷:

年:

1989

出版社:

Academic Press

语言:

english

页:

458

ISBN 10: